X Ray, Far, and Extreme Ultraviolet Coatings for Space Applications

Abstract

The idea of utilizing imaging mirrors as narrow band filters constitutes the basis of the design of extreme ultraviolet imagers operating at 58.4 nm and 83.4 nm. The net throughput of both imaging-filtering systems is better than 20 percent. The superiority of the EUV self-filtering camera/telescope becomes apparent when compared to previously theoretically designed 83.4-nm filtering-imaging systems, which yielded transmissions of less than a few percent and therefore less than 0.1 percent throughput when combined with at least two imaging mirrors. Utilizing the self-filtering approach, instruments with similar performances are possible for imaging at other EUV wavelengths, such as 30.4 nm. The self-filtering concept is extended to the X-ray region where its application can result in the new generation of X-ray telescopes, which could replace current designs based on large and heavy collimators