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A Method for Measuring the Spectral Normal Emittance in Air of A Variety of Materials Having Stable Emittance Characteristics

Abstract

A method and apparatus is described for the measurement of spectral normal emittance in air of a variety of materials. The system permits measurements to be performed over a wavelength region of 1.0 through 15.0 microns and over a temperature range of 600F to 1,8000F with an accuracy of 5.0 percent. The advantages of this system are described. Results obtained by this system are compared with results reported by another observer using a different technique

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