Nearly Optimal Bounds for Sample-Based Testing and Learning of kk-Monotone Functions

Abstract

We study monotonicity testing of functions f ⁣:{0,1}d{0,1}f \colon \{0,1\}^d \to \{0,1\} using sample-based algorithms, which are only allowed to observe the value of ff on points drawn independently from the uniform distribution. A classic result by Bshouty-Tamon (J. ACM 1996) proved that monotone functions can be learned with exp(O(min{1εd,d}))\exp(O(\min\{\frac{1}{\varepsilon}\sqrt{d},d\})) samples and it is not hard to show that this bound extends to testing. Prior to our work the only lower bound for this problem was Ω(exp(d)/ε)\Omega(\sqrt{\exp(d)/\varepsilon}) in the small ε\varepsilon parameter regime, when ε=O(d3/2)\varepsilon = O(d^{-3/2}), due to Goldreich-Goldwasser-Lehman-Ron-Samorodnitsky (Combinatorica 2000). Thus, the sample complexity of monotonicity testing was wide open for εd3/2\varepsilon \gg d^{-3/2}. We resolve this question, obtaining a tight lower bound of exp(Ω(min{1εd,d}))\exp(\Omega(\min\{\frac{1}{\varepsilon}\sqrt{d},d\})) for all ε\varepsilon at most a sufficiently small constant. In fact, we prove a much more general result, showing that the sample complexity of kk-monotonicity testing and learning for functions f ⁣:{0,1}d[r]f \colon \{0,1\}^d \to [r] is exp(Θ(min{rkεd,d}))\exp(\Theta(\min\{\frac{rk}{\varepsilon}\sqrt{d},d\})). For testing with one-sided error we show that the sample complexity is exp(Θ(d))\exp(\Theta(d)). Beyond the hypercube, we prove nearly tight bounds (up to polylog factors of d,k,r,1/εd,k,r,1/\varepsilon in the exponent) of exp(Θ~(min{rkεd,d}))\exp(\widetilde{\Theta}(\min\{\frac{rk}{\varepsilon}\sqrt{d},d\})) on the sample complexity of testing and learning measurable kk-monotone functions f ⁣:Rd[r]f \colon \mathbb{R}^d \to [r] under product distributions. Our upper bound improves upon the previous bound of exp(O~(min{kε2d,d}))\exp(\widetilde{O}(\min\{\frac{k}{\varepsilon^2}\sqrt{d},d\})) by Harms-Yoshida (ICALP 2022) for Boolean functions (r=2r=2)

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