Christian Colliex

Comptes Rendus Physique

Tome 15 (2014) – No 2–3Top left: Three orthogonal slices through the reconstruction of an Au nanorod, showing individual atompositions. For further information, see S. Bals et al., pp. 140–150. Top right: Schematics of the tip of a liquidflow specimen holder. For further information, see T. Schuh & N. de Jonge, pp. 214–223. Bottom left:Multicolour CL image obtained on a stack of GaN Quantum Discs (QDiscs) embedded in an AlN nanowire.For further information, see M. Kociak et al., pp. 158–175. Bottom right: Structural defect in reducedgraphene oxide. Shown are hexagons (blue), pentagons (pink) and heptagons or higher-ordered carbonrings (green). For further information, see C. Mangler & J. Meyer, pp. 241–257.DOSSIERSeeing and measuring with electrons: Transmission Electron Microscopy today and tomorrow /Voir et mesurer avec un faisceau d’électrons : La microscopie électronique à transmissionaujourd’hui et demainGuest editor / Rédacteur en chef invité : Christian Colliex• Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow –An introductionChristian Colliex . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101• Future directions in high-resolution electron microscopy: Novel optical components and techniquesPeter Hawkes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110• Measuring three-dimensional positions of atoms to the highest accuracy with electronsChristoph T. Koch, Wouter Van den Broek . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119• Interferometric methods for mapping static electric and magnetic fieldsGiulio Pozzi, Marco Beleggia, Takeshi Kasama, Rafal E. Dunin-Borkowski . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 126• Seeing and measuring in 3D with electronsSara Bals, Bart Goris, Thomas Altantzis, Hamed Heidari, Sandra Van Aert, Gustaaf Van Tendeloo . . . . . . . . . . . . 140• Elemental analysis down to the single atom with electron beamsKazu Suenaga . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151Continued on the next pageContents (continued)• Seeing and measuring in colours: Electron microscopy and spectroscopies applied to nano-opticsMathieu Kociak, Odile Stéphan, Alexandre Gloter, Luiz F. Zagonel, Luiz H.G. Tizei, Marcel Tencé,Katia March, Jean Denis Blazit, Zackaria Mahfoud, Arthur Losquin, Sophie Meuret, Christian Colliex . . . . . . . 158• Seeing in 4D with electrons: Development of ultrafast electron microscopy at CaltechJ. Spencer Baskin, Ahmed H. Zewail . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 176• Shaping electron beams for the generation of innovative measurements in the (S)TEMJo Verbeeck, Giulio Guzzinati, Laura Clark, Roeland Juchtmans, Ruben Van Boxem, He Tian, Armand Béché,Axel Lubk, Gustaaf Van Tendeloo . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 190• Visualising reacting single atoms under controlled conditions: Advances in atomic resolution in situEnvironmental (Scanning) Transmission Electron Microscopy (E(S)TEM)Edward D. Boyes, Pratibha L. Gai . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200• Liquid scanning transmission electron microscopy: Nanoscale imaging in micrometers-thick liquidsTobias Schuh, Niels de Jonge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 214• In situ mechanical TEM: Seeing and measuring under stress with electronsMarc Legros . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 224• Using electron beams to investigate carbonaceous materialsClemens Mangler, Jannik C. Meyer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 241• Using electron beams to investigate catalytic materialsBingsen Zhang, Dang Sheng Su . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 258• Networking strategies of the microscopy community for improved utilisation of advanced instruments: (1) TheAustralian Microscopy and Microanalysis Research Facility (AMMRF)Simon P. Ringer, Miles H. Apperley . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 269• Networking strategies of the microscopy community for improved utilization of advanced instruments: (2) Thenational network for transmission electron microscopy and atom probe studies in France (METSA)Thierry Épicier, Étienne Snoeck . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 276• Networking strategies of the microscopy community for improved utilisation of advanced instruments:(3) Two European initiatives to support TEM infrastructures and promote electron microscopy over Europe,ESTEEM (2006–2011) and ESTEEM 2 (2012–2016)Étienne Snoeck, Gustaaf Van Tendeloo . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 281Article original• Une transition liquide–gaz pour des bosons en interaction attractive à une dimensionChristopher Herzog, Maxim Olshanii, Yvan Castin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 285

Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction

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Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction

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