Measurements and modelling of free carrier lifetimes in Si and Si/poly-Si microrings

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Publication date
1 January 2023
Publisher
IEEE Xplore proceedings

Abstract

We report pump-probe experiments for measuring free carrier lifetime in Si and Si/poly-Si microrings and compare results with trap-assisted Shockley-Read-Hall recombination model

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    Last time updated on 05/03/2023