DETERMINATION OF THE THICKNESS AND OPTICAL PARAMETERS OF Gd2O3 THIN FILMS BASED ON THE INTERFERENCE EFFECT

Abstract

A set of key optical parameters of Gd2O3 thin films deposited on a glassy silica substrate by magnetron sputtering technique was determined using optical transmittance and absorption data. The refractive index dispersion in the wavelength range 400-660 nm was obtained by analyzing the interference

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