CORE
🇺🇦Â
 make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Structural Study of SiO_x Amorphous Thin Films by the Grazing Incidence X-ray Scattering (GIXS) Method
Authors
Kunioki Kato
Eiichiro Matsubara
+3Â more
Masatoshi Saito
Shinji Takayama
Yoshio Waseda
Publication date
27 January 2010
Publisher
'Tohoku University Medical Press'
Abstract
Abstract is not available.
Similar works
Full text
Available Versions
Institutional Repositories DataBase (IRDB)
See this paper in CORE
Go to the repository landing page
Download from data provider
oai:irdb.nii.ac.jp:00918:00004...
Last time updated on 06/09/2020