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Observation of idividual dislocations in 6H and 4H SiC by means of back-reflection methods of X-ray diffraction topography
Authors
Bakin
Bedynska
+13 more
Dudley
Hobgood
Huang
Härtwig
Lang
Morkoç
Pernot
Shaibani
Vetter
Wierzchowski
Wierzchowski
Wierzchowski
Yakimova
Publication date
1 January 2007
Publisher
Wiley-VCH
Doi
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Abstract
Abstract is not available.
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DESY
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oai:bib-pubdb1.desy.de:82176
Last time updated on 12/04/2020
Crossref
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Last time updated on 01/04/2019
DESY
See this paper in CORE
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oai:bib-pubdb1.desy.de:82175
Last time updated on 12/04/2020
DESY Publication Database
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oai:bib-pubdb1.desy.de:82175
Last time updated on 15/07/2014