Design of a Built-In Test Equipment for a X-band phased array radar system in SiGe BiCMOS technology

Abstract

In this work an X band Build In Test Equipment (BITE), implemented in the SiGe BiCMOS technology of Infineon, is presented. The possibility to perform precise measurements of phase shift and gain in the X- band, using lower frequency ( 4GHz-6GHz) automated test equipment (ATE), which is also used in WLAN devices, is investigated, leading to the design of the complete test equipment and finally to the full custom layout desig