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Improvement of Ic degradation of HTS Conductor (FAIR Conductor) and FAIR Coil Structure for Fusion Device
Authors
Tomosumi Baba
Noriko Chikumoto
+11Â more
Shinji Hamaguchi
Naoki Hirano
Akifumi Iwamoto
Akifumi Kawagoe
Ryozo Kawanami
Toshiyuki Mito
Yuta Onodera
Maki Otsuji
Suguru Takada
Kazuya Takahata
Nagato YANAGI
Publication date
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'
Abstract
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oai:irdb.nii.ac.jp:01130:00050...
Last time updated on 04/01/2022