The image quality of magnetic particle imaging depends on the interference-free measurement of the particlespectrum. Systematic errors due to harmonic distortions in the components used for implementation complicatethe development of efficient imaging devices. To test the suitability of parts for the development of MPIscanners, a test bench was developed in which the components to be tested can be integrated, to evaluate theirsuitability using the measured spectrum. Different forms of connectors integrated into the high-current pathwere analyzed for their influence on the signal quality using this test bench. An evaluation of this componentscan be made from the clearly visibible distortions in the spectrum recorded with the high-sensitive test system
