Fast frame-rates are desirable in scanning transmission electron microscopy
for a number of reasons: controlling electron beam dose, capturing in-situ
events or reducing the appearance of scan distortions. Whilst several
strategies exist for increasing frame-rates, many impact image quality or
require investment in advanced scan hardware. Here we present an interlaced
imaging approach to achieve minimal loss of image quality with faster
frame-rates that can be implemented on many existing scan controllers. We
further demonstrate that our interlacing approach provides the best possible
strain precision for a given electron dose compared with other contemporary
approaches
