Based on 1.89Γ108J/ΟβΞΞΛ Monte
Carlo (MC) events produced from a longitudinally-polarized electron beam, the
sensitivity of CP violation of Ξ decay is studied with fast
simulation software. In addition, the J/ΟβΞΞΛ decay can also be used as a process to optimize the detector
response using the interface provided by the fast simulation software. In the
future, STCF is expected to obtain 3.4 trillion J/Ο events, and the
statistical sensitivity of CP violation of Ξ decay via J/ΟβΞΞΛ process is expected to reach O~(10β5) when the electron beam polarization is 80\%