Synchrotron-based X-ray Fluorescence Ghost Imaging

Abstract

X-ray Fluorescence Ghost Imaging (XRF-GI) was recently demonstrated for x-ray lab sources. It has the potential to reduce acquisition time and deposited dose by choosing their trade-off with spatial resolution, while alleviating the focusing constraints of the probing beam. Here, we demonstrate the realization of synchrotron-based XRF-GI: We present both an adapted experimental setup and its corresponding required computational technique to process the data. This not only extends the above-mentioned advantages to synchrotron XRF imaging, it also presents new possibilities for developing strategies to improve precision in nano-scale imaging measurements