Transient Photoluminescence Microscopy (TPLM) allows for the direct
visualization of carrier transport in semiconductor materials with sub
nanosecond and few nanometer resolution. The technique is based on measuring
changes in the spatial distribution of a diffraction limited population of
carriers using spatiotemporal detection of the radiative decay of the carriers.
The spatial resolution of TPLM is therefore primarily determined by the
signal-to-noise-ratio (SNR). Here we present a method using cylindrical lenses
to boost the signal acquisition in TPLM experiments. The resulting asymmetric
magnification of the photoluminescence emission of the diffraction limited spot
can increase the collection efficiency by more than a factor of 10,
significantly reducing acquisition times and further boosting spatial
resolution.Comment: 12 pages, 5 figures, and supporting informatio