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research
Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
Authors
GA Botton
B. Bártová
+4 more
L-Y Chang
C. Hébert
S. Lazar
A Fontcuberta i. Morral
Publication date
2 August 2017
Publisher
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 - July 30, 200
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oai:doc.rero.ch:296273
Last time updated on 25/08/2017