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Atomic force microscopy as a suitable tool for probing the polar axis direction in electroactive P(VDF-co-TrFE) films at the nanoscale
Authors
Ahmed Addad
Sophie Barrau
+13 more
Vincent Bouad
Frédéric Cazaux
Antonio Da Costa
Rachel Desfeux
Anthony Ferri
Ahmad Hamieh
Vincent Ladmiral
Jean-Marc Lefebvre
Adeline Marin
M.M. Saj Mohan
Freddy Ponchel
Denis Remiens
Jean-François Tahon
Publication date
11 July 2022
Publisher
HAL CCSD
Abstract
National audienc
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oai:HAL:hal-03956501v1
Last time updated on 24/02/2023