Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Abstract
Demonstrated experimentally in this work was the possibility of controlled
handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor
surface by using an atomic force microscope under conditions of acoustic excitation. It
has been shown that the selective transport of particles of a certain size is possible owing
to the change of an ultrasonic vibration amplitude. Also in this study, possible
mechanisms in which ultrasound may influence the particle-surface interaction and the
probe-particle (surface) interaction have been analyzed