Characterization of traps in high resistivity silicon substrates and link with Radio Frequency performances

Authors
Publication date
1 January 2021
Publisher

Abstract

Abstract is not available.

    Similar works

    Full text

    thumbnail-image

    Available Versions

    DIAL UCLouvain

    redirect
    oaioai:dial.uclouvain.be:boreal:2...
    Last time updated on 14/01/2023