Using Small Angle Scattering and Atom Probe Tomography as Complementary Tools for Characterising Precipitate Microstructures at the Nanoscale

Authors
Publication date
1 January 2013
Publisher
HAL CCSD

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    HAL-CEA

    redirect
    oaioai:HAL:hal-00950644v1
    Last time updated on 18/02/2023