In this paper, the estimation of Nakagami-m short term fading severity parameter and
signal envelope average power are considered. Two methods enabling calculation severity
parameter of Nakagami-m fading and are average power of signal envelope propagation in
Nakagami-m fading channel by using measured values samples of Nakagami-m random process
is considered in this work. By using measured values moments of Nakagami-m random process
can be calculated. Nakagami-m fading parameters can be evaluated from moments. In this paper
is considered the case when fading parameters are calculated from the second moment and the
forth moment. Also, the case when Nakagami-m parameters are calculated by using the first, the
second and the three moment is studied. In this paper diversity technique is applied for
evaluation Nakagami-m fading parameters by using method of moments. Used diversity
technique has MRC (maximal ratio combining) receiver with two and three inputs operating over
independent and identical multipath fading channel. Moments of MRC receiver output signal
enable Nakagami-m fading parameters evaluation. The accuracy of obtained results increases as
the number of samples increases, the order of diversity increases and when the number of
realizations increases.
The second method studied in this paper, for estimating the Nakagami-m fading severity
parameter and average power of Nakagami-m fading signal envelope is level crossing method.
Level crossing rate is calculated for three values of signal envelope and from these three
equations evaluated Nakagami-m parameters. Obtained expressions for level crossing rate are
simple and Nakagami-m parameters can be determined. MRC diversity technique is applied for
the estimation of Nakagami-m fading severity parameter and Nakagami-m signal envelope
average power. The accurately of calculated values for Nakagami-m parameters increases as the
number of samples increases, the number of realization increases and MRC diversity order
increases. Also the accurately of obtained reports is higher for lower values of Nakagami-m
fading severity parameter.
*Application diversity technique for estimation of Nakagami-m fading parameters by
using the method moments is not considered in open technical literature.
*Level crossing rate method for estimation of Nakagami-m fading parameters is not
considered in open technical literature