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Compositional variations in In0.5Ga0.5N nanorods grown by molecular beam epitaxy

Abstract

The composition of InxGa1 − xN nanorods grown by molecular beam epitaxy with nominal x = 0.5 has been mapped by electron microscopy using Z-contrast imaging and x-ray microanalysis. This shows a coherent and highly strained core-shell structure with a near atomically sharp boundary between a Ga-rich shell (x∼0.3) and an In-rich core (x∼ 0.7), which itself has In- and Ga-rich platelets alternating along the growth axis. It is proposed that the shell and core regions are lateral and vertical growth sectors, with the core structure determined by spinodal decomposition

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