Charge transport processes at interfaces which are governed by complex
interfacial electronic structure play a crucial role in catalytic reactions,
energy storage, photovoltaics, and many biological processes. Here, the first
soft X-ray second harmonic generation (SXR-SHG) interfacial spectrum of a
buried interface (boron/Parylene-N) is reported. SXR-SHG shows distinct
spectral features that are not observed in X-ray absorption spectra,
demonstrating its extraordinary interfacial sensitivity. Comparison to
electronic structure calculations indicates a boron-organic separation distance
of 1.9 {\AA}, wherein changes as small as 0.1 {\AA} result in easily detectable
SXR-SHG spectral shifts (ca. 100s of meV). As SXR-SHG is inherently ultrafast
and sensitive to individual atomic layers, it creates the possibility to study
a variety of interfacial processes, e.g. catalysis, with ultrafast time
resolution and bond specificity
