A flexible Labview{trademark}-based data acquisition and analysis system for scanning microscopy

Abstract

A new data analysis system has been developed with computer-controlled beam and sample positioning, video sample imaging, multiple large solid angle detectors for x-rays and gamma-rays, and surface barrier detectors for charged particles. The system uses the LabVIEW{trademark} programming language allowing it to be easily ported between different computer operating systems. In the present configuration, digital signal processors are directly interfaced to a SCSI CAMAC controller. However, the modular software design permits the substitution of other hardware with LabVIEW-supported drivers. On-line displays of histogram and two-dimensional elemental map images provide a user-friendly data acquisition interface. Subregions of the two-dimensional maps may be selected interactively for detailed analysis or for subsequent scanning. Off-line data processing of archived data currently yields elemental maps, analyzed spectra and reconstructions of tomographic data