It has been shown that temperature ramp rates utilized in heat treatment schedules for internal tin processed Nb{sub 3}Sn wires substantially influence both hysteresis loss and critical current density J{sub c} of the wires, i.e. a slow ramp rate (e.g. 6{degree}C/h) favors a higher J{sub c} while a fast ramp (e.g. 60{degree}C/h)results in a low hysteresis loss of the wire