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Dielectronic recombination measurements on multicharged ions
Authors
S. Datz
P. F. Dittner
P. D. Miller
P. L. Pepmiller
Publication date
1 January 1985
Publisher
Oak Ridge National Laboratory
Abstract
Coaxial electron beams and multiply charged ion beams are used to study dielectronic recombination. The study includes recombination of boron, carbon and sulfur. 3 refs., 7 figs. (WRF
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Last time updated on 09/07/2019