'Institute of Electrical and Electronics Engineers (IEEE)'
Abstract
X-ray diffraction is a material-specific technique, the results of which can be used as a material fingerprint to identify unknowns. In this paper we present an adaptation to a novel hybrid angular- and energy-dispersive X-ray diffraction technique, which, until now, has been limited in utility by sample thickness. Computed tomography techniques have been applied to spatially resolve the origin of the scattering signals and to reconstruct the diffraction pattern in each pixel. 2D cross-correlation has been used to compare the reconstructed data to a library of standards as a means of identifying the material present