Automated measurements of junction characteristics to evaluate parameters for semiconductor diodes

Abstract

517-522Using National Instrument’s LabVIEW (Laboratory Virtual Instrument Engineering Workbench), a graphical programming language, we have measured the junction characteristics of different diodes in the temperature range 273-373 K. The PCI-6024E Data Acquisition Board and BNC-2120 for the acquisition of the data have been used. LabVIEW’s Controls and Functions enable one to control the experiment, measure the parameters, analyze and process the data. Ideality factor , reverse saturation current I0, and material constant B have been evaluated using I-V characteristics. The barrier height B and the band-gap energy EG, have been measured and compared using both I-V and C-V characteristics. For Schottky diode, the series resistance RS, and B can be calculated using the Norde method. The band-gap energy has been measured using constant current source. Here, we have characterized p-n junction diodes viz. 1N5402, 1N5408, 1N4148, and 6A4. In addition, LabVIEW may be used to characterize other junction diodes like zener diode, LED, varactor diode, Schottky diode, etc