Mine, Nicolas

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Institutional Repository - Research PortalDépôt Institutionnel - Portail de la RechercheTHESIS / THÈSEAuthor(s) - Auteur(s) :Supervisor - Co-Supervisor / Promoteur - Co-Promoteur :Publication date - Date de publication :Permanent link - Permalien :Rights / License - Licence de droit d’auteur :Bibliothèque Universitaire Moretus Plantinresearchportal.unamur.beUniversity of NamurDOCTEUR EN SCIENCESTOF-SIMS molecular depth profiling of polymers and organic materials using lowenergy atomic primary ions for sputteringMine, NicolasAward date:2012Awarding institution:Universite de NamurLink to publicationGeneral rightsCopyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright ownersand it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights.            • Users may download and print one copy of any publication from the public portal for the purpose of private study or research.            • You may not further distribute the material or use it for any profit-making activity or commercial gain            • You may freely distribute the URL identifying the publication in the public portal ?Take down policyIf you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediatelyand investigate your claim.Download date: 23. Jun. 2020          ToF-SIMS molecular depth profiling of polymers and organic materials using low energy atomic primary ions for sputtering  (Profilage moléculaire de polymères et de matériaux organiques en ToF-SIMS à l’aide d’ions primaires atomiques de basse énergie pour l’érosion.)              Composition du jury :  Dr. Tom Wirtz Prof. Patrick Bertrand Prof. Benoît Champagne Prof. J.-J. Pireaux Prof. L. Houssiau (promoteur)  Thèse présentée par  Nicolas Mine en vue de l’obtention  du grade de Docteur en Sciences  Faculté des Sciences  Département de Physique Centre de Recherche en Physique  de la Matière et du Rayonnement (PMR) Université de Namur  Décembre 2012 

TOF-SIMS molecular depth profiling of polymers and organic materials using low energy atomic primary ions for sputtering

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TOF-SIMS molecular depth profiling of polymers and organic materials using low energy atomic primary ions for sputtering

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