The combination of relief and deformation measurement is investigated for improving
the accuracy of Electronic Speckle-Pattern Interferometry (ESPI) data. The nature of
sensitivity variations within different types of interferometers and with different shapes
of objects is analysed, revealing significant variations for some common
interferometers. Novel techniques are developed for real-time measurement of
dynamic events by means of carrier fringes. This allows quantification of deformation
and relief, where the latter is used in the correction of the sensitivity variations of the
former
