Andreasen, Jan Lasson

Arentoft, Mogens

Buchard Jørgensen, Per

Christensen, Lars Bager

De Chiffre, Leonardo

Feidenhans'l, Robert Krarup

Schmidt, Per René

Thestrup Jensen, Niels

Vester-Christensen, Martin

Vinter, Brian

The innovation consortium project, carried out September 2009 – August 2013, has aimed to help the participating companies and Danish industry with the introduction of CT scanning as measuring technology, carrying out research at international level. The project has operated through five main activities: Centre of Excellence, Dissemination, Collaboration, Research, and Initiation of new activities. The consortium has consisted of nine partners, including three research institutions, two consultancy partners, two large companies, and two small / medium enterprises. The consortium has acted as a centre of excellence for industrial CT scanning, both nationally and internationally. A network with approx. 40 participants has been established, and a total of 22 students have been educated. Dissemination activities have encompassed: a web page www.cia-ct.mek.dtu.dk , 8 newsletters, 4 topical conferences, 5 seminars and workshops, and 61 publications. Collaboration has been established with a number of national and international actors in the field of CT, including societies and research organisations. Five major research projects have been carried out: 1) CT scanning for coordinate metrology; 2) Data processing for high speed scanning; 3) New beam sources and signal conditioning; 4) Equipment with high stability beam source; 5) Quality assurance and automation. A number of new activities have been initiated from the project, including participation in two new project proposals. The project represents a major step forward towards the industrial application of CT scanning in Denmark.<br/

Online Research Database In Technology

Centre for Industrial Application of CT scanning (CIA-CT) – Four years of results 2009-2013

http://orbit.dtu.dk/ws/files/97324897/Centre_for_Industrial_Application.pdf

Centre for Industrial Application of CT scanning (CIA-CT) – Four years of results 2009-2013

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