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Interface engineered electron and hole tunneling
Authors
L. Tao, M. Li, Z. Liu, W. Lin, G. Zhou, X. Chen, X. Yan, H. Tian, E. Y. Tsymbal, and J. Chen, R. Guo
Publication date
1 January 2021
Publisher
DigitalCommons@University of Nebraska - Lincoln
Abstract
Abstract is not available.
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Last time updated on 05/10/2022
