The manufacture of lattice geometries via Additive Manufacturing (AM) has the potential
to impact the production of low-volume, high cost, complex components. However, the
qualification of lattice geometries provides several challenges for traditional metrological
techniques, limiting the use of these structures within industry. While recent studies in AM
part qualification have improved its practice, the measurement of lattice structures unique to
additive manufacturing is not well understood and methods to support traceability have yet
to be developed. In this dissertation, a methodology to determine measurement uncertainty
in the measurement of AM lattice components is developed. A refined sampling registration
approach for lattice geometry based on spatially-dependent subsampling is derived and
is shown to statistically decrease variation between measurement sources. The importance
of sampling location in tactile measurements of components produced using additive manufacturing
is investigated and recommends that definition of inspection locations/methods
be integrated into the design cycle of AM parts. The substitution method is investigated
to determine uncertainty in the measurement of AM lattice structures using X-ray Computed
Tomography (XCT). A measurement artifact is developed and measured using the
substitution method. The use of reporting measurement uncertainty using uncorrected bias
is explored for strut diameter measurements. Components identical to the measurement
artifact are manufactured using AM and measured to determine manufacturing variation.
The uncertainty in XCT measurement of these AM components is determined using the
substitution method and methods to report uncorrected bias. This study provides a methodology
to design inspection routines for the qualification of a lattice component, furthers the
scientific understanding XCT measurements of AM components, and lays the groundwork
for further implementation of the presented method.Ph.D