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Evaluation Of Electrostatic Discharge (Esd) Characteristics For Bottom Contact Organic Thin Film Transistor
Authors
Aihua Dong
Linfeng He
+3 more
Zhuoyu Ji
Zhiwei Liu
Long Wang
Publication date
23 December 2013
Publisher
'Information Bulletin on Variable Stars (IBVS)'
Abstract
Electrostatic discharge (ESD) performance of the bottom-contact organic thin-film transistors (OTFT) is investigated experimentally for the first time using the transmission line pulsing technique. The failure currents and leakage currents of OTFTs having different channel lengths and finger structures are characterized. Physical insights and measured data are offered to explain the failure of these devices at relatively low ESD stress level. © 2013 IEEE
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Last time updated on 18/10/2022