Influence of Temperature and Concentration on the Self-Assembly of Nonionic CiEjSurfactants: A Light Scattering Study

Abstract

Nonionic poly(ethylene oxide) alkyl ether (Ci_{i}iEj_{j}) surfactants self-assemble into aggregates of various sizes and shapes above their critical micelle concentration (CMC). Knowledge on solution attributes such as CMC as well as aggregate characteristics is crucial to choose the appropriate surfactant for a given application, e.g., as a micellar solvent system. In this work, we used static and dynamic light scattering to measure the CMC, aggregation number (Nagg_{agg}), and hydrodynamic radius (Rh_{h}) of four different Ci_{i}Ej_{j} surfactants (C8_{8}E5_{5}, C8_{8}E6_{6}, C10_{10}E6_{6}, and C10_{10}E8_{8}). We examined the influence of temperature, concentration, and molecular structure on the self-assembly in the vicinity of the CMC. A minimum in the CMC vs temperature curve was identified for all surfactants investigated. Further, extending the hydrophilic and hydrophobic chain lengths leads to an increase and decrease of the CMC, respectively. The size of the aggregates strongly depends on temperature. Nagg_{agg} and Rh_{h} increase with increasing temperature for all surfactants investigated. Additionally, Nagg_{agg} and Rh_{h} both increase with increasing surfactant concentration. The data obtained in this work further improve the understanding of the influence of temperature and molecular structure on the self-assembly of Ci_{i}iEj_{j} surfactants and will further foster their use in micellar solvent systems

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