CORE
🇺🇦
make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Multifrequency X,W-band ESR study on photo-induced ion radical formation in solid films of mono- and di-fullerenes embedded in conjugated polymers
Authors
Aganov A.
Ecke G.
+8 more
Egbe D.
Konkin A.
Krinichnyi V.
Mamin G.
Orlinskii S.
Ritter U.
Romanus H.
Scharff P.
Publication date
1 January 2014
Publisher
Abstract
Anion-cation radical formation in solid films of M3EH-PPV blended with C60-PCBM, C120-O-PCBM and C60-MDHE, C 120-O-MDHE under diode laser (532 nm) and Xe-lamp light excitation studied by means of X,W-band at temperatures 30-80 K is reported. Subsequent high frequency W-band ESR data demonstrate the reproducible, but variable effect of appreciable dispersion (D) contribution in the ESR spectral line for the di-fullerene anion radicals. It is suggested that the increase of the D part relative to the absorption (A) in the summarized ESR absorption line in blends with difullerenes is caused by the higher value of difullerene medium conductivity. The obtained data are quantitatively discussed by the D/A ∼ F(d/δ) functional dependence in approach of plane film geometry, where d is the film thickness and δ is the skin-depth. The influence of ν-dependent δ at D/A value has been checked using X-band LESR. © 2014 Elsevier Ltd. All rights reserved
Similar works
Full text
Open in the Core reader
Download PDF
Available Versions
Kazan Federal University Digital Repository
See this paper in CORE
Go to the repository landing page
Download from data provider
oai:dspace.kpfu.ru:net/135998
Last time updated on 07/05/2019