Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires

Authors
Publication date
1 December 2011
Publisher
HAL CCSD

Abstract

LGEP 2011 ID = 88

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Hal-Diderot

    redirect
    oaioai:HAL:hal-00710790v1
    Last time updated on 14/04/2021