Scanning electrochemical microscopy (SECM) is a highly versatile method for measuring and imaging a wide range of systems. When paired with an intricately made ultramicroelectrode (UME) probe, SECM becomes an even more powerful tool for imaging microscale features in a system. However, purchasing these UME’s comes at a high cost with less ability for modification. Having high quality UME’s expands the ability of SECM and enables precise measuring and imaging in a wide range of applications such as solar cells in Dr. Ding’s lab, and corroding metals in Dr. Gateman’s lab. To combat this issue of high cost and set specifications, a simple and fast methodology for preparing UME’s was developed
