Development of CMOS Digital Integration Temperature Sensor

Abstract

为了准确监测65 nm工艺的高速CPU芯片的工作温度,以保证CPU工作时风扇的运转以及过热报警,本文介绍了0.6μm的CMOS工艺设计实现的一种集成I2C总线通讯的具有远程测温功能的智能温度传感芯片.详细介绍了串联晶体管结构和Δ-ΣA/D转换技术、非重叠的控制时钟和CMOS开关的消除电荷注入误差的设计,使温度精度达到0.2℃;输出数字信号与I2C总线通讯的接口设计简化了后续信号处理和接口电路设计.测试结果表明,检测的温度范围从-15℃到95℃,本地温度误差在1℃以内,远程温度误差在0.75℃以内.In order to accurately monitor the temperature of 65 nm process microprocessors and turn on the system fans or shutdown the system,a digital integration temperature sensor used 0.6 μm standard complementary metal-oxide semiconductor(CMOS) technology with I2C management bus interface is presented in this paper,which can monitor the temperature of a remote diode.We used two series-wound bipolar,Δ-Σ A/D converter,and non-overlapping clock as well as CMOS switches to eliminate charge injection error,which make the temperature accuracy 0.2℃.Digital signal output communicated with I2C management bus,simplifies the signal processing and interface circuit.The test result shows that the circuit can provide a resolution of 1℃ at local channel and 0.75℃ at remote channel from-15℃ to 105℃.福建省自然科学基金(2002H020)资

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