Abstract

Thin films of Cu(In,Ga)Se2 on Mo coated glass substrates were studied by photolumines-cence (PL) technique before and after irradiation with a dose of 1.8·1015 cm–2 of 10 MeV electrons to determine the nature of radiation defects in Cu(In,Ga)Se2.Работа выполнена при финансовой поддержке РНФ (проект № 17-12-01500)

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