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Effects of strain and film thickness on rhombohedral phase stability of HfO2
Authors
Q. Yang, L. l. Tao, Y. Zhou, E. Y. Tsymbal, and V. Alexandrov, Y. Zhang
Publication date
1 January 2020
Publisher
DigitalCommons@University of Nebraska - Lincoln
Abstract
Abstract is not available.
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Last time updated on 05/10/2022
