Quantitative material characterization based on the spectral decomposition of X-ray tomographic images

Abstract

A single-energy CT provides a map of gray levels simply related to X-rays linear attenuation coefficients, which could be very similar for different materials at a given energy. Images acquired at multiple energies allows for a quantitative description of an object. In this work, phantom images were acquired using synchrotron radiation CT at precisely defined energies. A successful attempt was made to differentiate the phantom materials with respect to their decomposition into basis materials

    Similar works