Automatic recognition and inspection of two-dimensional manufactured components

Abstract

This thesis presents new developments in the field of recognition and inspection of 2D manufactured components. It discusses the problem of recognition and inspection of such components, which may be either flawed or partially completed. Several new methods are proposed that are designed to be used in the solution of this problem. These methods may be divided into two categories. The first involves the component of interest being processed via a suitable feature extraction scheme. This scheme makes measurements of local geometric features of the component which are, by nature, invariant of the component’s position, orientation and scale. These features are known as local features of the component, because they are calculated for only a portion of the area or outline of the entire component. Global features, which are extracted from the whole outline, are not immediately useful because the contribution of acceptable or unacceptable variations, spurious additions and omissions are all arbitrarily combined together, that is, smoothed over. An algorithm is then used to compare the features extracted from the component with the same type of features extracted from its reference component. Each individual geometric entity of the component may be identified after using this process. The second category concerns itself with the replacement of measured point data, derived from the outline of the component, with substitute geometric entities, such as straight lines and circular arcs. This replacement is necessary because measured point data does not describe a manufactured component in the same way as that of the design specification. Only when such a substitution takes place can a spatial comparison between corresponding individual entities be performed, based on the design specifications. In addition, the relationship between the most widely used invariant moments, and Fourier descriptors, is investigated. Fourier Analysis is often used in image processing and Fourier descriptors are often readily available so, for this reason, it is useful to compute invariant moments by using Fourier descriptors. This thesis is organized as follows: Chapter 1 outlines previous research in this field, the need for current research, and the scope of this work. Chapter 2 is devoted to the new subpolygon method. This method is developed for recognition and inspection of relatively simple manufactured components. Chapter 3 proposes the new line-moment method of feature extraction, which is designed for the more complex manufactured components which may be less conveniently examined by the using the subpolygon method. The simplicity and effectiveness, as well as the applications, of line moments are also demonstrated. In addition, the algorithm designed for matching this type of feature with geometric entities is described. Chapter 4 briefly reviews the method of extracting a component’s global features by applying a Fourier Analysis. Since Fourier descriptors and moment invariants are two important types of extracted invariant features, the major concern of this chapter is the development of a mathematical relationship between the two. Several examples involving the use of this method are included later in the chapter. Chapter 5 proposes a novel algorithm for generating substitute geometries, such as lines and arcs, from measured sample point data, such as digitises or pixels. It enables a final comparison between the geometries of a component based on its design specifications. Errors due to the substitution are then minimised. and the deviations between the substitute geometry and the measured sample points may then be calculated. Chapter 6 concludes the thesis and recommends possible further research

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