Influence of misfit strain on the physical properties of Fe thin films

Abstract

We investigate the growth of thin Fe layers on MgAl2_2O4_4 (001) and MgO (001) substrates using dc magnetron sputtering. The crystal quality of Fe layers deposited on MgAl2_2O4_4 is found to be substantially higher as compared to Fe grown on MgO substrates. The effects of the crystal quality on the magnetic and electric transport properties are discussed.Comment: 8 pages, 6 figure

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