Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

Authors
Publication date
19 July 2021
Publisher
The Optical Society of America
Doi

    Abstract

    We demonstrate optical arbitrary waveform measurement (OAWM) using a silicon pho-tonic spectral slicer. Exploiting maximal-ratio combining (MRC), we demonstrate the viability of the scheme by reconstructing 100-GBd 64QAM signals with high quality

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