1994 International Symposium on Electromagnetic Compatibility (EMC\u2794/Sendai), May 16 - 20, 1994, Hotel Sendai Plaza, Miyagi, Japa

Kobayashi  Ryuichi

Kuwabara Nobuo

Tajima  Kimihiro

Kyutacar : Kyushu Institute of Technology Academic Repository

High sensitivity electric field sensor usingMach-Zehnder interferometer著者 Kuwabara Nobuo, Tajima  Kimihiro, Kobayashi Ryuichijournal orpublication title1994 International Symposium onElectromagnetic Compatibilitypage range 810year 1994-05-01URL http://hdl.handle.net/10228/00008556HIGH SENSITIVITY ELECTRIGFffiLD SENSOR USING MACH�ZEHNDER Nol.mo KUW' ABAR.A; Kimihirn TAJIMA, and Ryuichi KOBAYASHI NT'f Telecmnrrm.nieation Networks Laboratories 9-H Midori-Obo 3-0lwme Muisashino-Shi, Tokyo 180 Japan1. IntroductionRecent progress in electromagnetic (EMC) has created a need for a wide-band electric field sensor for measuring electromagnetic pulses and the performance of the EMC measurement facilities [l] El<'lctric firJd sensors using 9ptic�l modulators expected tci b� used sub� measdrements b�cause operate·',over a wide-band frequency range and most of the composed materials are nonmetallic. However, the sensitiv.1ty, and the frequency response need to be im­proved. This paper proposes an field sensor that uses a Mach-Zehnder interferometer which achieves these improvement. 2. ConfigurationThe configuration of the new sensor is shown inFig.l. It consists of an optical source, a pair of op­tical ,fibers,. an aad a electromagnetic a voltage is modulates the optical power according to the voltage. The electric field strength is obtained by measuring the stg·nal. ;1. Perfon1ance The sensitivity achieve high the sensor e.mploys a is half-wave voltage is less than 3 V and range, whose bias angle ia tuned to get the best ivity. The minimum detected fi�ld strength of the sensor with resistive elements and The frequency response of sensor is shown in F:lg.3. This sensor uses approximately lGcm long resis-tive element to the r�sonance by the element. This from lkHz The resonance due to the elastic wave in the substrate reduces the performance of the frequency response. By employing a new substrate shape to reduce the resonance c,msed by the elastic wave, the deviation was reduced from 4 dB to 1 dB[2]. The ivity of the sensor drifts due to temperature changes caused by accumulation of charge between the electrodes of th� interferometer. A conductive layer is formed o.n the LiNb03 substrate to discharge the accumulated charge. The deviation of this sells or is within 2 dB from 5 to 45 degrees [ 3] . This sensor can be used to eva1uate_the of EMC measurement facili tie.s and for measuring electromagnetic pulses generated by electrostatic dis­charges. Future problems are the further.impr.ovement of sensitivity and the development of new applications. Optical source Electric field Poraizati.on :maint!liru fiber interferometer Fig,3 Frequency :response ofthe Reference [ l]JVL Tokuda and Kuwahara; "Recent pr optic antennas EMC measurement", Commun,, Vol No.3, March 1992 [2]N. Kuwabaraand R. Kobayashi;"Frequeimprovement of electric filedmodulator'', IEEE IM Tech. Conf.,[3]R. Kobayashi et. al;temperature-stabilized electricmach-zehnder interferometer", IEEEEMC-94/SENDAI, Sendai, May 1994.

High sensitivity electric field sensor using Mach-Zehnder interferometer

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High sensitivity electric field sensor using Mach-Zehnder interferometer

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Kyutacar : Kyushu Institute of Technology Academic Repository