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Crystalline TiO2 protective layer with graded oxygen defects for efficient and stable silicon-based photocathode
Authors
A Kay
A Landman
+46 more
AG Scheuermann
B Seger
B Seger
CG Morales-Guio
D Bae
D Bae
D Kang
DV Esposito
F Liu
I Oh
J Feng
J Gu
J Gu
J Oh
J Oh
J Pan
J Zhao
J Zheng
JB Sambur
JC Hill
JD Benck
JH Montoya
JY Zheng
JY Zheng
K Sun
L Ji
L Ji
MG Kast
MH Lee
MJ Kenney
Q Wang
RN Dominey
S Chen
S Chu
S Hu
S Oh
SW Boettcher
SY Reece
X Chen
X Zhou
Y Hou
Y Lin
Y Yan
Y Yu
YW Chen
Z Wang
Publication date
1 January 2018
Publisher
'Springer Science and Business Media LLC'
Doi
Abstract
© 2018, The Author(s). The trade-offs between photoelectrode efficiency and stability significantly hinder the practical application of silicon-based photoelectrochemical devices. Here, we report a facile approach to decouple the trade-offs of silicon-based photocathodes by employing crystalline TiO2 with graded oxygen defects as protection layer. The crystalline protection layer provides high-density structure and enhances stability, and at the same time oxygen defects allow the carrier transport with low resistance as required for high efficiency. The silicon-based photocathode with black TiO2 shows a limiting current density of ~35.3 mA cm-2 and durability of over 100 h at 10 mA cm-2 in 1.0 M NaOH electrolyte, while none of photoelectrochemical behavior is observed in crystalline TiO2 protection layer. These findings have significant suggestions for further development of silicon-based, III–V compounds and other photoelectrodes and offer the possibility for achieving highly efficient and durable photoelectrochemical devices
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Last time updated on 18/04/2019
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Last time updated on 04/12/2019