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Charge Carrier Injection and Trapping in the Buried Oxides of SOI Structures
Authors
A Boutry-Forveille
A Jauhiainen
+45 more
A Stesmans
AG Revesz
AG Revesz
AN Nazarov
AN Nazarov
C Chen
CS Ngwa
D Arnold
D Ballutaud
DA Bachanan
DE Ioannou
DJ DiMaria
DJ DiMaria
DJ DiMaria
DJ DiMaria
DJ Maria Di
DJ Maria Di
I Strzalkowski
J Margail
J Stoemenos
K Nagai
K Vanhensden
M Bruel
M Bruel
M Lenzlinger
MV Fischetti
MV Fischetti
N Klein
P Samanta
RAB Devine
S Bengtsson
S Bengtsson
S Hall
S Kranse
S Mayo
SP Wainwright
T Ouisse
TC Sah
TC Sah
TH Ning
VV Afanasev
VV Afanasev
WL Warren
Y Nissan-Cohen
ZA Weinberg
Publication date
1 January 2002
Publisher
'Springer Science and Business Media LLC'
Doi
Abstract
Abstract is not available.
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info:doi/10.1007%2F978-94-010-...
Last time updated on 22/07/2021