Electrical Properties
- Authors
- A Goetzberger
- A Piotrowska
- AC Lynch
- Agilent Technologies
- Agilent Technologies
- Agilent Technologies
- Agilent Technologies
- AK Jonsher
- AM Nicolson
- ASTM
- ASTM
- AW Kraszewski
- BD Josephson
- CH Hamann
- CH He
- CJF Bottcher
- CNR Rao
- CP Smyth
- DA Gray
- DC Look
- DF Evans
- DIN
- DIN
- DL Partin
- DV Lang
- DW Davidson
- DW Davies
- EB Hansen
- EH Rhoderick
- F Alvarez
- F Brinkmann
- F Kremer
- G Jones
- G Kent
- G Rietveld
- GI Woolaver
- GL Miller
- H Fröhlich
- H Kamerlingh Onnes
- H Schäfer
- HE Bussey
- Hewlett Packard
- HH Berger
- Institute for Printed Circuits
- J Baker-Jarvis
- J Bardeen
- J Clarke
- J Krupka
- J Obrzut
- JC Maxwell
- JG Bednorz
- JK Hunton
- JOM Bockris
- JP Grant
- JP Runt
- K Kurokawa
- K Ziegler
- KS Cole
- L Hartshorn
- LJ Pauw van der
- LJ Pauw van der
- MA Stuchly
- MF Iskander
- MK Wu
- N Hill
- NG McCrum
- OF Mohammed
- P Blood
- P Saulnier
- P Saulnier
- P Spitzer
- PW Atkins
- PW Debye
- R Pöpel
- RH Cox
- RL Petritz
- RN Hall
- S Havriliak
- S Ramo
- SM Sze
- SO Nelson
- SR Forest
- SS Stuchly
- SS Stuchly
- TS Light
- VV Daniel
- VV Novikov
- W Meissner
- W Shockley
- WA Harrison
- WC Johnson
- WL Marshall
- YC Wu
- YC Wu
- Publication date
- 1 January 2006
- Publisher
- 'Springer Science and Business Media LLC'
- Doi
Abstract
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Last time updated on 20/07/2021