Thin Films for Microelectronics and Photonics: Physics, Mechanics, Characterization, and Reliability
- Authors
- A. Ballato
- A. Bolshakov
- A. Lodha
- A.A. Volinsky
- A.A. Volinsky
- A.A. Volinsky
- A.A. Volinsky
- A.A. Volinsky
- A.F. Jankowski
- A.K. Sikder
- A.L. Shull
- A.W. Lawson
- B.C. Johnson
- B.D. Cullity
- C. Moglestue
- C.A. Harper
- C.E. Schuster
- C.K. Hu
- D. Josell
- D. Kramer
- D.A. Hardwick
- D.A. La Van
- D.B. Marshall
- D.L. Smith
- D.R. Lide
- D.T. Read
- D.T. Read
- D.T. Read
- D.T. Read
- D.T. Read
- D.T. Read
- E. Arzt
- E.S. Machlin
- F.C. Brown
- F.R. Brotzen
- G. Dieter
- G. Simmons
- H. Conrad
- H. Koezuka
- H.B. Huang
- H.D. Espinosa
- H.T.G. Hentzell
- I. Hofinger
- J. Schiotz
- J.A. Floro
- J.A. Ruud
- J.B. Pethica
- J.B. Vella
- J.C. Fox
- J.F. Nye
- J.G. Swadener
- J.L. Beuth
- J.L. Loubet
- J.M.E. Harper
- J.R. Greer
- J.R. Greer
- J.V. Atanasoff
- J.W. Hutchinson
- J.W. Hutchinson
- K.E. Petersen
- K.M. Liechti
- L.B. Freund
- M. Charalambides
- M. Kachanov
- M. Lane
- M. Morgen
- M. Ohring
- M. Ohring
- M. Ueki
- M. Zirngibl
- M.A. Haque
- M.A. Haque
- M.A. Haque
- M.B. Anand
- M.D. Kriese
- M.D. Kriese
- M.D. Thouless
- M.F. Doerner
- M.F. Doerner
- M.K. Small
- M.M. Lima de
- M.R. Landingham Van
- M.Y. Kwak
- N. Tamura
- O. Chyan
- P.M. Osterberg
- R. Berriche
- R. Dauskardt
- R.B. King
- R.G. Munro
- R.R. Keller
- R.R. Keller
- S.G. Malhotra
- S.M. Wiederhorn
- S.V. Hainsworth
- S.W. Russell
- T.L. Becker
- T.P. Weihs
- T.Y. Tsui
- V.P. Burolla
- W. Zhang
- W.C. Oliver
- W.D. Nix
- W.N. Sharpe
- W.N. Sharpe
- X.D. Li
- X.Y. Ding
- Y. Hanaoka
- Y. Okada
- Y.D. Jeon
- Y.H. Wang
- Y.L. Loo
- Y.L. Shen
- Y.S. Touloukian
- Publication date
- 1 January 2007
- Publisher
- 'Springer Science and Business Media LLC'
- Doi
Abstract
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Last time updated on 20/07/2021